Control particles at the scale of precision manufacturing.

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Airborne Particle Counter for Electronics & semiconductor

Electronics & semiconductor application: Portable airborne-particle measurement for cleanroom verification, reporting, and point-of-use investigation.

Airborne particles scatter light when illuminated, a phenomenon known as light scattering. Scattering depends on particle size, light wavelength, particle refractive index, and the light absorption characteristics of the particles. For scattered-light intensity and particle size, particle counters follow a basic principle: the intensity of light scattered by a particle increases as its surface area increases. Measuring scattered-light intensity therefore allows particle size to be inferred. This is the basic operating principle of a light-scattering particle counter.

Clean Environment Online Monitoring System for Electronics & semiconductor

Electronics & semiconductor application: Continuous environmental data collection, alarming, reporting, and connection to wider production systems.

Product advantages:

  1. A powerful software system compatible with sensors from domestic and international brands, including lighthouse, METONE, and PMS, with free lifetime upgrades.
  2. Open data interfaces enable seamless connections with users’ MES/SCADA and other systems.
  3. Comprehensive functions for compliance with 21CFR, part11 regulations.
  4. Powerful user management with permission settings for more than 1000 users.
  5. Switch between real-time and historical data curves.
  6. Remote, around-the-clock real-time monitoring data reports.
  7. Remote instrument calibration is fast and flexible, without disassembly or return to the factory.
  8. HJCLEAN software includes free lifetime upgrades.
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